Ab Initio Study of the Valence-electron Relaxation Effect on X-ray Emission Spectra and the Excitionic Effect on Electron-energy-loss Spectra of the SiL2,3 Edge

Ma, H.H.Ma林聖賢Carpenter, R. W.R. W.CarpenterSankey, O. F.O. F.SankeyLin, Sheng-HsienSheng-HsienLin2009-01-202018-07-102009-01-202018-07-101991http://ntur.lib.ntu.edu.tw//handle/246246/102331en-USAb Initio Study of the Valence-electron Relaxation Effect on X-ray Emission Spectra and the Excitionic Effect on Electron-energy-loss Spectra of the SiL2,3 Edgejournal article