Modulation of Minority Carriers in the C-V Characteristics of MIS Tunneling Diode by Surrounding MOS Capacitor

T.H.LeeC.S.LiaoJ.G.HwuJENN-GWO HWU2019-10-312019-10-31201719386737https://scholars.lib.ntu.edu.tw/handle/123456789/429076Modulation of Minority Carriers in the C-V Characteristics of MIS Tunneling Diode by Surrounding MOS Capacitorjournal article10.1149/08001.0387ecst2-s2.0-85050008744