Absolute depth measurement using multiphase normalized cross-correlation for precise optical profilometry

Duong, D.-H.D.-H.DuongChen, C.-S.C.-S.ChenLIANG-CHIA CHEN2021-02-042021-02-042019Duong, D.-H.;Chen, C.-S.;Chen, L.-C.https://www.scopus.com/inward/record.url?eid=2-s2.0-85074272659&partnerID=40&md5=949e52a4ca4a0e3cfd6c7930ba746098https://scholars.lib.ntu.edu.tw/handle/123456789/547486Absolute depth measurement using multiphase normalized cross-correlation for precise optical profilometryjournal article10.3390/s192146832-s2.0-85074272659