Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si<inf>1-x-y</inf>Ge<inf>x</inf>C<inf>y</inf> alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))

Amour, A.St.A.St.AmourLiu, C.W.C.W.LiuSturm, J.C.J.C.SturmLacroix, Y.Y.LacroixThewalt, M.L.W.M.L.W.ThewaltCHEE-WEE LIU2020-06-162020-06-161995https://scholars.lib.ntu.edu.tw/handle/123456789/502088Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si<inf>1-x-y</inf>Ge<inf>x</inf>C<inf>y</inf> alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))other2-s2.0-51149205708https://www.scopus.com/inward/record.uri?eid=2-s2.0-51149205708&partnerID=40&md5=855fcbbb567834d7954c38c6b62ee4eb