林浩雄Jih, H. J.H. J.JihLin, Hao-HsiungHao-HsiungLin2009-02-042018-07-062009-02-042018-07-061989http://ntur.lib.ntu.edu.tw//handle/246246/121462en-USMinority-Carrier Lifetime Measurement Using an Al/SiO2/p-Si MOS Capacitorconference paper