Scanning electron microscope identification of weak links in superconducting thin films

Monroe, DonDonMonroeBrocklesby, WSWSBrocklesbyFarrow, RCRCFarrowMINGHWEI HONGLiou, S. H.S. H.Liou2018-09-102018-09-101988http://scholars.lib.ntu.edu.tw/handle/123456789/340153Scanning electron microscope identification of weak links in superconducting thin filmsjournal article