I. S. LinV. C. SuJ. B. KuoD. ChenC. S. YehC. T. TsaiM. MaJAMES-B KUO2018-09-102018-09-102008-01http://scholars.lib.ntu.edu.tw/handle/123456789/342561STI-Induced Mechanical-Stress-Related Kink Effect of 40nm PD SOI NMOS Devicesconference paper