The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networks

H.C.LuTAH HSIUNG CHU2018-09-102018-09-102004-06http://scholars.lib.ntu.edu.tw/handle/123456789/310501[SDGs]SDG7The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networksconference paper10.1109/mwsym.2004.1338952