Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICs

W.-A. LinC.-C. LiJ.-L. HuangJIUN-LANG HUANG2018-09-102018-09-102011-05http://scholars.lib.ntu.edu.tw/handle/123456789/366765Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICsconference paper10.1109/VTS.2011.57837402-s2.0-79959664514