Ronning, F.F.RonningKim, C.C.KimShen, K. M.K. M.ShenArmitage, N. P.N. P.ArmitageDamascelli, A.A.DamascelliLu, D. H.D. H.LuFeng, D. L.D. L.FengShen, Z. X.Z. X.ShenMiller, L. L.L. L.MillerKim, Y. J.Y. J.KimChou, F.F.ChouTerasaki, I.I.Terasaki2020-04-212020-04-21200301631829https://www.scopus.com/record/display.uri?eid=2-s2.0-0037438270&origin=resultslist&sort=plf-f&src=s&st1=Universality+of+the+electronic+structure+from+a+half-filled+CuO2+plane&st2=&sid=a5ae368deb0b540f28f5af71e5a8bd71&sot=b&sdt=b&sl=85&s=TITLE-ABS-KEY%28Universality+of+the+electronic+structure+from+a+half-filled+CuO2+plane%29&relpos=0&citeCnt=18&searchTerm=https://scholars.lib.ntu.edu.tw/handle/123456789/485146journal article