Kao, Hsien-PeiHsien-PeiKaoTung, Tzu-ChiaTzu-ChiaTungChen, Hong-YiHong-YiChenWong, Cheng-ShihCheng-ShihWongCHIOU-SHANN FUH2020-05-042020-05-042017https://scholars.lib.ntu.edu.tw/handle/123456789/488064[SDGs]SDG11Pin Defect Inspection with X-ray Images.conference paper10.1007/978-3-319-59081-3_54https://doi.org/10.1007/978-3-319-59081-3_54