Shallow level trap formation in SiO2 induced by high field and thermal stresses

Lin, H.-P.H.-P.LinHwu, J.-G.J.-G.HwuJENN-GWO HWU2018-09-102018-09-102008http://www.scopus.com/inward/record.url?eid=2-s2.0-44649124815&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/338628Shallow level trap formation in SiO2 induced by high field and thermal stressesjournal article10.1063/1.2924428