Sampling variation caused by A/D cards due to external trigger

Jaw, F. -S.F. -S.JawLin, C. -W.C. -W.LinWang, C. -Y.C. -Y.Wang2009-02-112018-06-292009-02-112018-06-291995http://ntur.lib.ntu.edu.tw//handle/246246/128178application/pdf348420 bytesapplication/pdfen-USSampling variation caused by A/D cards due to external triggerjournal article10.1016/0165-0270(95)00059-3WOS:A1995TL54900023http://ntur.lib.ntu.edu.tw/bitstream/246246/128178/1/02.pdf