A new NBTI characterization method on polycrystalline silicon thin-film transistors

CHEE-WEE LIUSun, H.-C.H.-C.SunHuang, C.-F.C.-F.HuangChen, Y.-T.Y.-T.ChenLiu, C.W.C.W.LiuHsu, Y.-C.Y.-C.HsuShih, C.-C.C.-C.ShihChen, J.-S.J.-S.ChenCHEE-WEE LIU2018-09-102018-09-102008http://www.scopus.com/inward/record.url?eid=2-s2.0-77954100055&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/341161A new NBTI characterization method on polycrystalline silicon thin-film transistorsconference paper