Wu A.T.Tu K.N.Lloyd J.R.Tamura N.Valek B.C.C. ROBERT KAO2019-11-272019-11-27200400036951https://www.scopus.com/inward/record.uri?eid=2-s2.0-7544234470&doi=10.1063%2f1.1795353&partnerID=40&md5=b1ad8bd64585b781cebbf177efb90fb8https://scholars.lib.ntu.edu.tw/handle/123456789/432719Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffractionjournal article10.1063/1.17953532-s2.0-7544234470