Reduced Process Induced Threshold Voltage Variability in Bulk Negative Capacitance Junctionless Transistors

R, Ruma SRuma SRVITA PI-HO HUGupta, ManishManishGupta2025-10-272025-10-272025-03-09https://scholars.lib.ntu.edu.tw/handle/123456789/732946Reduced Process Induced Threshold Voltage Variability in Bulk Negative Capacitance Junctionless Transistorsconference proceedings10.1109/edtm61175.2025.11041130