Comprehensive study on negative capacitance effect observed in MOS(n) capacitors with ultrathin gate oxides

Chang, S.-J.S.-J.ChangHwu, J.-G.J.-G.HwuJENN-GWO HWU2018-09-102018-09-102011http://www.scopus.com/inward/record.url?eid=2-s2.0-79952036866&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/363036Comprehensive study on negative capacitance effect observed in MOS(n) capacitors with ultrathin gate oxidesjournal article10.1109/TED.2010.2102033