Two states phenomenon in the current behavior of metal-oxide-semiconductor capacitor structure with ultra-thin SiO 2

JENN-GWO HWU2018-09-102018-09-102012http://www.scopus.com/inward/record.url?eid=2-s2.0-84865425160&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/370332Two states phenomenon in the current behavior of metal-oxide-semiconductor capacitor structure with ultra-thin SiO 2journal article10.1063/1.4746284