Oxide-GaAs interfacial electronic properties characterized by modulation spectroscopy of photoreflectance

Hwang, JSJSHwangWang, YCYCWangChou, WYWYChouTyan, SLSLTyanMINGHWEI HONGMannaerts, JPJPMannaertsKwo, JJKwoothers2018-09-102018-09-101998http://scholars.lib.ntu.edu.tw/handle/123456789/340147Oxide-GaAs interfacial electronic properties characterized by modulation spectroscopy of photoreflectancejournal article10.1063/1.3670472-s2.0-0002958773