李源弘2006-07-252018-06-282006-07-252018-06-282000http://ntur.lib.ntu.edu.tw//handle/246246/12362DPG 石墨為含碳鐵水於冷卻過程中造成碳含量固溶極限值降低而析出的碳石墨材料。但因其為硼及鐵元素的觸媒作用而產生高結晶性的石墨，故與Kish Graphite 不盡相同。本次實驗是利用在鐵中不同硼含量產生DPG 高結晶性石墨，所得之石墨進行XRD 繞射及SEM 為結構觀察，得此石墨粉末特性。將X 光繞射所獲得之實驗數值，利用Reitveld Method 精算其結晶構造並進行石墨化度的評估，可知新製程石墨皆有很高的石墨化度，約為95%，與DPG-CH(96%)相去不遠，是一高結晶性的石墨，且在D0 與DPG-CH 的XRD 繞射圖中在低角度發現有碳六十（C60）的繞射峰存在。精算過後其中所含有的碳六十（C60）約為5~6%。此製程所得之人工石墨相當特殊，具有高石墨化度，且其中含有碳六十（C60）。When the solid solubility limit is lowered by cooling the iron-carbon liquid, the DPG precipitates on the liquid. It’s different from Kish Graphite. The high degree of graphitization graphite is produced with the catalysts of iron and boron. In this experiment, we produce the DPG graphite by the variation content of boron in the ironcarbon liquid. The DPG is characterized by X-Ray Diffraction and Scanning Electric Microscope. The X-Ray Diffraction patterns are refined by Rietveld method to identity its exact degree of graphitization. The high degree of graphitization of the new produced graphite is about 95% as good as the DPGCH that produced before (about 96%). The XRD peaks in the profile of fullerenes had also been discovered on the low angle and there are about 5~6% fullerenes in the DPG graphite. We also observe the carbon tube in the D0 from SEM.application/pdf630250 bytesapplication/pdfzh-TW國立臺灣大學材料科學與工程學研究所X-Ray 繞射石墨碳六十（C60）X-Ray DiffractionRietveld MethodGraphiteFullerenes（C60）SEMreporthttp://ntur.lib.ntu.edu.tw/bitstream/246246/12362/1/892214E002018.pdf