Photoluminescence and Raman Scattering characterization of GaN, InGaN and AlGaN films using a UV Excitation Raman-Photoluminescence microscope

Feng, Z.C.Z.C.FengSchurman, M.M.SchurmanTran, C.C.TranSalagaj, T.T.SalagajKarlicek, B.B.KarlicekFerguson, I.I.FergusonStall, R.A.R.A.StallDyer, C.D.C.D.DyerWilliams, K.P.J.K.P.J.WilliamsPitt, G.D.G.D.Pitt2010-09-022018-07-052010-09-022018-07-051998-01http://ntur.lib.ntu.edu.tw//handle/246246/193687en-USPhotoluminescence and Raman Scattering characterization of GaN, InGaN and AlGaN films using a UV Excitation Raman-Photoluminescence microscopejournal article