Comparing retention and recombination of electrically injected carriers in Si quantum dots embedded in Si-rich SiN <inf>x</inf> films

Lin, C.-D.C.-D.LinCheng, C.-H.C.-H.ChengLin, Y.-H.Y.-H.LinWu, C.-L.C.-L.WuPai, Y.-H.Y.-H.PaiGONG-RU LIN2020-06-112020-06-112011https://scholars.lib.ntu.edu.tw/handle/123456789/500268Comparing retention and recombination of electrically injected carriers in Si quantum dots embedded in Si-rich SiN <inf>x</inf> filmsjournal article10.1063/1.36635302-s2.0-83755173238https://www.scopus.com/inward/record.uri?eid=2-s2.0-83755173238&doi=10.1063%2f1.3663530&partnerID=40&md5=d60c36d4895396d4c81531cb8aead8b1