Image quality improvement in atomic force microscopy using a novel control strategy

PING-LANG YEN2018-09-102018-09-102011http://www.scopus.com/inward/record.url?eid=2-s2.0-79960470355&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/362685Image quality improvement in atomic force microscopy using a novel control strategyjournal article10.1166/asl.2011.1502