The Roughness-Enhanced Light Emission from Metal-Oxide-Silicon Light-Emitting Diodes Using Very High Vacuum Prebake

Lee, Min-HungMin-HungLeeChen, Kuan-FuKuan-FuChenLai, Chang-ChiChang-ChiLaiLiu, Chee WeeChee WeeLiuPai, Woei-WuWoei-WuPaiChen, Miin-JangMiin-JangChenLin, Ching-FuhChing-FuhLin2009-03-182018-07-062009-03-182018-07-062002http://ntur.lib.ntu.edu.tw//handle/246246/145936http://ntur.lib.ntu.edu.tw/bitstream/246246/145936/1/45.pdfapplication/pdf58217 bytesapplication/pdfen-USThe Roughness-Enhanced Light Emission from Metal-Oxide-Silicon Light-Emitting Diodes Using Very High Vacuum Prebakejournal article10.1143/JJAP.41.L326http://ntur.lib.ntu.edu.tw/bitstream/246246/145936/1/45.pdf