Test generation of path delay faults induced by defects in power TSV

Shih, C.-J.C.-J.ShihHsieh, S.-A.S.-A.HsiehLu, Y.-C.Y.-C.LuLi, J.C.-M.J.C.-M.LiWu, T.-L.T.-L.WuTZONG-LIN WUYI-CHANG LUCHIEN-MO LI2020-06-112020-06-112013https://scholars.lib.ntu.edu.tw/handle/123456789/498068Test generation of path delay faults induced by defects in power TSVconference paper10.1109/ATS.2013.182-s2.0-84893436993https://www.scopus.com/inward/record.uri?eid=2-s2.0-84893436993&doi=10.1109%2fATS.2013.18&partnerID=40&md5=f1f5f24206fe6aa814ff1027e3880c77