Reliability-Tolerant Design for Ultra-Thin-Body GeOI 6T SRAM Cell and Sense Amplifier

V. P.-H. HuVITA PI-HO HUV. P.-H. Hu胡璧合2020-10-072020-10-072017https://scholars.lib.ntu.edu.tw/handle/123456789/516587Reliability-Tolerant Design for Ultra-Thin-Body GeOI 6T SRAM Cell and Sense Amplifierjournal article10.1109/jeds.2016.26447242-s2.0-85014029544