Huang, K.-Y.K.-Y.HuangShen, T.-Y.T.-Y.ShenCHIEN-MO LI2020-06-292020-06-292017https://scholars.lib.ntu.edu.tw/handle/123456789/505989Test Methodology for Dual-rail Asynchronous Circuitsconference paper10.1145/3061639.30623252-s2.0-85023640285https://www.scopus.com/inward/record.uri?eid=2-s2.0-85023640285&doi=10.1145%2f3061639.3062325&partnerID=40&md5=2dfe9b35011a120a5a6f5756f6cfbeb6