Zheng, W.W.ZhengJang, L.-Y.L.-Y.JangLee, J.-M.J.-M.LeeZheng, R.S.R.S.ZhengCHEE-WEE LIUBecla, P.P.BeclaFeng, Z.C.Z.C.Feng2018-09-102018-09-10201310226680http://www.scopus.com/inward/record.url?eid=2-s2.0-84873278189&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/380227https://www.scopus.com/inward/record.uri?eid=2-s2.0-84873278189&doi=10.4028%2fwww.scientific.net%2fAMR.634-638.2489&partnerID=40&md5=9f9624a320ea3ad2371019b914c683afHigh-resolution synchrotron radiation x-ray absorption data on Mn K- and L3-edge for semimagnetic semiconductor Zn1-xMnxTe bulk materials are presented. A detailed analysis of the extended x-ray absorption fine structure by using the IFEFFIT program, and the chemical bonds of Mn-Te are obtained. The x-ray absorption near-edge structure of the Mn K- and L3-edges are investigated, and the electronic structure of Zn1-xMnxTe with various compositions are studied. © (2013) Trans Tech Publications, Switzerland.Extended X-ray absorption fine structure; X-ray absorption fine structure; X-ray absorption near-edge structure; ZnMnTeBulk materials; Extended X-ray absorption fine structures; High resolution; IFEFFIT; Semimagnetic semiconductor; X ray absorption fine structures; X-ray absorption near-edge structure; ZnMnTe; Absorption spectra; Chemical bonds; Electronic structure; Extended X ray absorption fine structure spectroscopy; Metallurgical engineering; Semiconducting tellurium; X ray absorption; Zinc; Manganeseconference paper10.4028/www.scientific.net/AMR.634-638.24892-s2.0-84873278189