Minority lifetime degradation of silicon wafers after electric zone melting

Wu, M.C.M.C.WuYang, C.F.C.F.YangLan, C.W.C.W.LanCHUNG-WEN LAN2020-01-062020-01-062015https://scholars.lib.ntu.edu.tw/handle/123456789/444847[SDGs]SDG7Minority lifetime degradation of silicon wafers after electric zone meltingjournal article10.1016/j.jcrysgro.2015.03.0412-s2.0-84926686316https://www.scopus.com/inward/record.uri?eid=2-s2.0-84926686316&doi=10.1016%2fj.jcrysgro.2015.03.041&partnerID=40&md5=46c9742bfc9e54e6ca09fc83afe9eae0