High-stability quantum dot passivated with low temperature atomic layer deposition 3-in-1 full-color light-emitting diodes

Huang Y.-MLiou Y.-HLiu A.-CCHIEN-CHUNG LINKuo H.-C.2022-04-252022-04-252021https://www.scopus.com/inward/record.uri?eid=2-s2.0-85120451820&partnerID=40&md5=483686058b07ce94a2ca2d06309298d9https://scholars.lib.ntu.edu.tw/handle/123456789/606999We report a 3-in-1 mini-light emitting diode and combine ink-jet printing technique to achieve a full color in monolithic chip. Finally, make reliability test by low-temperature ALD technology at 2020 color gamut of red and green QDs during 300 hours reliability test under 50°C /50% RH condition. ? 2021 OSA.Atomic layer depositionColorInk jet printingLightOrganic light emitting diodes (OLED)PassivationTemperatureALD technologyAtomic-layer depositionColor-light-emittingFull colorInk-jet printingLightemitting diodeLows-temperaturesMonolithic chipPrinting techniquesReliability testSemiconductor quantum dotsHigh-stability quantum dot passivated with low temperature atomic layer deposition 3-in-1 full-color light-emitting diodesconference paper2-s2.0-85120451820