Improvement in radiation-hard CMOS logic gates for noise margin

Dept. of Electr. Eng., National Taiwan Univ.Yih, S.-J.S.-J.YihChang, M.-L.M.-L.ChangHwu, J.-G.J.-G.HwuFeng, W.-S.W.-S.Feng2007-04-192018-07-062007-04-192018-07-061997-06http://ntur.lib.ntu.edu.tw//handle/246246/2007041910031906application/pdf274104 bytesapplication/pdfen-USImprovement in radiation-hard CMOS logic gates for noise marginjournal article10.1109/ISCAS.1997.621525http://ntur.lib.ntu.edu.tw/bitstream/246246/2007041910031906/1/00621525.pdf