Lee, Chih-KungChih-KungLeeWu, Giin-YuanGiin-YuanWuTeng, C. T.C. T.TengWu, Wen-JongWen-JongWuLin, C. T.C. T.LinHsiao, W. H.W. H.HsiaoShih, H. C.H. C.ShihWang, J. S.J. S.WangLin, S. C.S. C.LinLin, C. C.C. C.LinLee, C. F.C. F.LeeLin, Yen-ChenYen-ChenLin2009-02-042018-06-292009-02-042018-06-29199900214922http://ntur.lib.ntu.edu.tw//handle/246246/120132https://www.scopus.com/inward/record.uri?eid=2-s2.0-0032590306&doi=10.1143%2fjjap.38.1730&partnerID=40&md5=1da73090e08f241afce20aefdd40bf4eThe design thinking, implementation, and testing results of a newly developed Doppler interferometer is described. The three built-in measuring modes including (1) single-beam mode for measuring absolute vibration, (2) dual-beam for measuring differential vibration, and (3) distance measuring, are all presented. To facilitate the application of this interferometer for advanced optical storage applications, a circular polarization interferometer configuration was adopted to arrive at a compact size and to enable the adoption of a built-in microscopic imaging system that can be used both as an alignment aid and as a sample imaging system. The configuration of the inherent dynamic system analysis capabilities that can be used to investigate the Bode plot of optical storage systems is also examined in detail. The nanometer resolution and megahertz bandwidth capabilities of this interferometer were verified in various advanced optical storage systems related experiments. ©1999 Publication Board, Japanese Journal of Applied Physics.application/pdf1948579 bytesapplication/pdfen-USDoppler effect; Flying height measurement; Flying height modulation; Interferomter; Near-field optical recording; Optical storage; VibrometerDistance measurement; Doppler effect; Optical data storage; Optical design; Optical recording; Vibration measurement; Bandwidth; Imaging systems; Laser applications; Laser recording; Light polarization; Optical resolving power; Doppler interferometers; Flying height measurement; Flying height modulation; Laser Doppler interferometers; Interferometersjournal article10.1143/JJAP.38.17302-s2.0-0032590306WOS:000081768600034http://ntur.lib.ntu.edu.tw/bitstream/246246/120132/1/11.pdf