Chen, J. Z.J. Z.ChenCherenack, K.K.CherenackTsay, C.C.TsayCheng, I-C.I-C.ChengWagner, S.S.Wagner2010-09-272018-07-052010-09-272018-07-052008-02http://ntur.lib.ntu.edu.tw//handle/246246/205583en-USEffects of SiNx passivation layer and gate metal roughness on the performance of on-plastic a-Si:H TFTsjournal article