JIUN-LANG HUANGJ.-J. HuangY.-S. Liu2018-09-102018-09-102006-0609238174https://www.scopus.com/inward/record.uri?eid=2-s2.0-33747881745&doi=10.1007%2fs10836-006-8600-0&partnerID=40&md5=5531177677ab6149482990ef91db9f26In this paper, we present a BIST technique that measures the RMS value of a Gaussian distribution period jitter. In the proposed approach, the signal under test is delayed by two different delay values and the probabilities it leads the two delayed signals are measured. The RMS jitter can then be derived from the probabilities and the delay values. Behavior and circuit simulations are performed to validate the proposed technique and analyze the design tradeoffs, and preliminary measurement results on FPGA are also presented. © 2006 Springer Science + Business Media, LLC.application/pdfapplication/pdfBuilt-in self-test; Jitter measurement; Random jitterCircuit theory; Computer simulation; Jitter; Probability; Signal theory; Built-in self-test; Jitter measurements; Random jitters; Built-in self testconference paper10.1007/s10836-006-8600-02-s2.0-33747881745WOS:000240143200002