Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of InGaN-based light-emitting diodes

CHIEH-HSIUNG KUAN2018-09-102018-09-102013http://www.scopus.com/inward/record.url?eid=2-s2.0-84903788255&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/379938Investigation of nano-sized hole/post patterned sapphire substrates-induced strain-related quantum-confined stark effect of InGaN-based light-emitting diodesconference paper