黃俊郎臺灣大學：電子工程學研究所楊博安Yang, Bo-AnBo-AnYang2007-11-272018-07-102007-11-272018-07-102005http://ntur.lib.ntu.edu.tw//handle/246246/57462由於時脈偏移(clock skew)的限制，並列通信(parallel communication)已經在資料傳輸速度上遇到瓶頸，而正逐漸的被高時脈速度(clock rate)的串列通信(serial communication)所取代。 TDR雖為一cable錯誤診斷的利器，但在只須決定待測cable是否滿足規格的生產測試(manufacturing testing)環境中，並不符合經濟效益。本論文所要發展的，便是針對pass/fail測試的高速資料輸傳輸媒介測試技術。 在本論文中，為了降低測試系統的複雜度，針對較容易出現的錯誤特性，根據TDR (Time Domain Reflectometry)原理，建立入射與反射信號關係模型，再加上coherent under-sampling 信號擷取的方式，以較低頻率的信號擷取高速信號，可以降低對部分高速元件的需求，以達到降低測試成本的目標。Due to the limitation of clock skew, parallel communication has reached the bottleneck in terms of data transmission. As a result, parallel communication is gradually being replaced by high-speed serial communication. TDR is effective fault diagnosis instrument for cable testing. However, it is not economical to identify whether the product is pass or fail in manufacturing testing. We proposed an economical testing technique to identify pass/fail of high speed transmission media. To reduce the complexity of testing system, the relationship model of incident signal and reflective signal is build according to frequent fault characteristics and time domain reflectometry theorem. The requirement of high-speed devices is lower because high frequency signals can be sampled by low frequency using coherent under-sampling method. The testing cost has been reduced because the requirement of high-speed devices is lower.中文摘要 i Abstract ii Chapter 1 Introduction 1 Chapter 2 Preliminaries 3 2.1 Time Domain Reflectometry (TDR) 4 2.1.1 TDR Architecture 4 2.1.2 Location of the Fault 6 2.1.3 TDR Operation Principles 7 2.1.4 TDR Resolution and Rise Time 10 2.1.5 Differential TDR Measurements 11 2.2 Coherent Under-Sampling 13 2.3 Common Interconnection Test Methodology 16 Chapter 3 Proposed Test Architecture 17 3.1 Overview of Test Architecture 17 3.2 Test Methodology 18 3.3 Test Time Analysis 21 3.4 Simulation Setup & Results 21 3.4.1 Uniform Cable as Defect-Free DUT 22 3.4.2 One Impedance Fault in the Single-Defect DUT 23 3.4.3 Two Impedance Faults in the Double-Defect DUT 24 Chapter 4 Experimental Results 27 Chapter 5 Conclusions and Future Work 29 Reference 301038469 bytesapplication/pdfen-US高速度串列通信類比電路測試serial transmission mediathesishttp://ntur.lib.ntu.edu.tw/bitstream/246246/57462/1/ntu-94-R91943086-1.pdf