Investigation of electromagnetic interferences caused by the stacked I/O connectors

Chou, H.-H.H.-H.ChouTuan, S.-C.S.-C.TuanChou, H.-T.H.-T.ChouLee, Y.-S.Y.-S.LeeHSI-TSENG CHOU2018-09-102018-09-102011http://www.scopus.com/inward/record.url?eid=2-s2.0-80054984182&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/365193[SDGs]SDG7Investigation of electromagnetic interferences caused by the stacked I/O connectorsconference paper10.1109/APS.2011.5996868