The study of electrical characteristics of heterojunction based on ZnO nanowires using ultrahigh-vacuum conducting atomic force microscopy

He, J. H.J. H.HeHo, C. H.C. H.Ho2009-03-112018-07-062009-03-112018-07-062007http://ntur.lib.ntu.edu.tw//handle/246246/144158application/pdf261700 bytesapplication/pdfen-USThe study of electrical characteristics of heterojunction based on ZnO nanowires using ultrahigh-vacuum conducting atomic force microscopyjournal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/144158/1/03.pdf