High-sensitivity imaging with lateral resonance mode atomic force microscopy

Ding, R.-F.R.-F.DingYang, C.-W.C.-W.YangHuang, K.-Y.K.-Y.HuangHwang, I.-S.I.-S.HwangKUANG-YUH HUANG2020-01-132020-01-132016https://scholars.lib.ntu.edu.tw/handle/123456789/447731[SDGs]SDG11High-sensitivity imaging with lateral resonance mode atomic force microscopyjournal article10.1039/c6nr04151e2-s2.0-84994681144https://www.scopus.com/inward/record.uri?eid=2-s2.0-84994681144&doi=10.1039%2fc6nr04151e&partnerID=40&md5=1a26ae2061b8ba78b0bf02647e8bc21e