Lin, M. T.M. T.LinHo, C. H.C. H.HoChang, C. R.C. R.ChangMINN-TSONG LINCHING-RAY CHANG2019-12-192019-12-1920010021-8979https://scholars.lib.ntu.edu.tw/handle/123456789/436636Temperature-dependence of interlayer exchange bias coupling in NiO/Cu/NiFejournal article10.1063/1.1361259WOS:000169151700309