Comprehensive study of bias temperature instability on polycrystalline silicon thin-film transistors

CHEE-WEE LIUHuang, C.-F.C.-F.HuangChen, Y.-T.Y.-T.ChenSun, H.-C.H.-C.SunLiu, C.W.C.W.LiuHsu, Y.-C.Y.-C.HsuShih, C.-C.C.-C.ShihLin, K.-C.K.-C.LinChen, J.-S.J.-S.ChenCHEE-WEE LIU2018-09-102018-09-102008http://www.scopus.com/inward/record.url?eid=2-s2.0-60649098199&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/341158Comprehensive study of bias temperature instability on polycrystalline silicon thin-film transistorsconference paper10.1109/ICSICT.2008.4734622