Direct measurement of interfacial structure in epitaxial Gd <inf>2</inf>O<inf>3</inf> on GaAs (0 0 1) using scanning tunneling microscopy

Chiu, Y.P.Y.P.ChiuShih, M.C.M.C.ShihHuang, B.C.B.C.HuangShen, J.Y.J.Y.ShenHuang, M.L.M.L.HuangLee, W.C.W.C.LeeChang, P.P.ChangChiang, T.H.T.H.ChiangHong, M.M.HongYA-PING CHIUMINGHWEI HONG2019-12-272019-12-272011https://scholars.lib.ntu.edu.tw/handle/123456789/443360Direct measurement of interfacial structure in epitaxial Gd <inf>2</inf>O<inf>3</inf> on GaAs (0 0 1) using scanning tunneling microscopyconference paper10.1016/j.mee.2011.03.0422-s2.0-79958021479https://www.scopus.com/inward/record.uri?eid=2-s2.0-79958021479&doi=10.1016%2fj.mee.2011.03.042&partnerID=40&md5=e066d965bd136552acde9aab2e56a066