Performance prediction and function recovery of CMOS circuits damaged by Co-60 irradiation

Dept. of Electr. Eng., National Taiwan Univ.Chang-Liao, K.-S.K.-S.Chang-LiaoHwu, J.-G.J.-G.Hwu2007-04-192018-07-062007-04-192018-07-061992-07N/Ahttp://ntur.lib.ntu.edu.tw//handle/246246/2007041910042711application/pdf399017 bytesapplication/pdfen-USPerformance prediction and function recovery of CMOS circuits damaged by Co-60 irradiationjournal articlehttp://ntur.lib.ntu.edu.tw/bitstream/246246/2007041910042711/1/00143328.pdf