Demonstration of edge roughness effect on the magnetization reversal of spin valve submicron wires

Chiang, T.W.T.W.ChiangChang, L.J.L.J.ChangYu, C.C.YuSSU-YEN HUANGChen, D.C.D.C.ChenYao, Y.D.Y.D.YaoLee, S.F.S.F.Lee2018-09-102018-09-102010http://www.scopus.com/inward/record.url?eid=2-s2.0-77955139044&partnerID=MN8TOARShttp://scholars.lib.ntu.edu.tw/handle/123456789/356413Demonstration of edge roughness effect on the magnetization reversal of spin valve submicron wiresjournal article10.1063/1.34634592-s2.0-77955139044