Chang, Jonathan T.-Y.Jonathan T.-Y.ChangTseng, Chao-WenChao-WenTsengLi, Chien-Mo JamesChien-Mo JamesLiPurtell, MikeMikePurtellMcCluskey, Edward J.Edward J.McCluskeyCHIEN-MO LI2020-06-292020-06-291998https://scholars.lib.ntu.edu.tw/handle/123456789/505977Analysis of pattern-dependent and timing-dependent failures in an experimental test chip.conference paper10.1109/TEST.1998.743151https://doi.org/10.1109/TEST.1998.743151