Chou Y.; Lee C.; Liaw P.K.; Chou Y.-C.YI-CHIA CHOU2022-06-302022-06-30202110735623https://www.scopus.com/inward/record.uri?eid=2-s2.0-85103194190&doi=10.1007%2fs11661-021-06215-7&partnerID=40&md5=f014bc7eaf97b82db5de274120350540https://scholars.lib.ntu.edu.tw/handle/123456789/614648High annular angle dark field-scanning transmission electron microscopy (HAADF-STEM) was used to directly measure the lattice distortion of NbTaTiV and NbTaTiVZr by fitting the images with a two-dimensional (2-D) Gauss function. The effect of the scanning direction and the accuracy of the HAADF-STEM method were discussed, and the lattice distortion factors in NbTaTiV and NbTaTiVZr were 0.113 and 0.155 Å, respectively. © 2021, The Minerals, Metals & Materials Society and ASM International.High resolution transmission electron microscopy; Niobium alloys; Niobium metallography; Scanning electron microscopy; Tantalum alloys; Titanium alloys; Titanium metallography; Vanadium alloys; Vanadium metallography; Zircaloy; Zirconium metallography; Dark field; Gauss function; HAADF-STEM; Lattice distortions; Scanning transmission electron microscopy; Two Dimensional (2 D); Tantalum metallographyjournal article10.1007/s11661-021-06215-72-s2.0-85103194190