Depth profiling the electronic structures at HfO<inf>2</inf>/Si interface grown by molecular beam epitaxy

Lay, T.S.T.S.LayChang, S.C.S.C.ChangDin, G.J.G.J.DinYeh, C.C.C.C.YehHung, W.H.W.H.HungLee, W.G.W.G.LeeKwo, J.J.KwoMINGHWEI HONG2019-12-272019-12-272005https://scholars.lib.ntu.edu.tw/handle/123456789/443458Depth profiling the electronic structures at HfO<inf>2</inf>/Si interface grown by molecular beam epitaxyconference paper10.1116/1.18816332-s2.0-31144436801https://www.scopus.com/inward/record.uri?eid=2-s2.0-31144436801&doi=10.1116%2f1.1881633&partnerID=40&md5=a9e80d22dd7bc44d655c55c973dffa1b