Cheng, Hao TienHao TienChengZhang, TaixianTaixianZhangYang, Yun ChengYun ChengYangLiu, Te HuaTe HuaLiuCHAO-HSIN WU2024-04-032024-04-032022-01-019798350350012https://scholars.lib.ntu.edu.tw/handle/123456789/641733Investigation on the failure mechanisms of 850 nm vertical-cavity surface-emitting laser (VCSEL) chips in the high-temperature operating life (HTOL) stress tests are presented. Selected failed chips are put into further analysis to study their early failure mechanisms.conference paper10.1109/CLEO-PR62338.2022.104322612-s2.0-85187009964https://api.elsevier.com/content/abstract/scopus_id/85187009964