國立臺灣大學電機工程學系黃瑞澤2006-09-272018-07-062006-09-272018-07-062003http://ntur.lib.ntu.edu.tw//handle/246246/20060927122807992389Quality of the clock signal plays an import role in modern high-speed systems because most activities are synchronized to the clock. However, in the existence of jitter, the clock edges may deviate from their ideal positions. To tolerate this, one has to lengthen the clock period, which degrades the system performance. Measuring high-speed clock jitters is a difficult task which relies on expensive ATE (automatic test equipment) and usually requires long test time. One promising solution to alleviate these problems is built-in self-test (BIST). Since on-chip BIST circuitry can be made close to the signal sources under test, accessing embedded signals becomes much easier and not limited by the bandwidth of the I/O pins.application/pdf92859 bytesapplication/pdfzh-TWthesishttp://ntur.lib.ntu.edu.tw/bitstream/246246/20060927122807992389/1/00000000000000000000000000000000000000000001.pdf