Characterization of gasochromic vanadium oxides films by X-ray absorption spectroscopy

Ho, Y. K.Y. K.HoChang, C. C.C. C.ChangWei, D. H.D. H.WeiDong, C. L.C. L.DongChen, C. L.C. L.ChenChen, J. L.J. L.ChenJang, W. L.W. L.JangHsu, C. C.C. C.HsuChan, T. S.T. S.ChanKumar, KrishnaKrishnaKumarChang, C. L.C. L.ChangWu, M. K.M. K.WuJERRY CHENG-CHE HSU2020-01-062020-01-0620130040-6090https://scholars.lib.ntu.edu.tw/handle/123456789/445425Characterization of gasochromic vanadium oxides films by X-ray absorption spectroscopyjournal article10.1016/j.tsf.2013.02.080WOS:000324309100089